Yep. So, you alluded to it in the way you asked the question, Charles. Remember, probe-cards are a consumable that's specific to each customer chip design or each customer mask set. So, if we take the HBM example, as a customer moves not just from HBM3 to HBM3e to HBM4, that certainly drives demand for new probe-cards. But even inside those generations of HBM, there are multiple flavors of HBM. And so, you can think about three or four major HBM3 designs all requiring different probe-cards. Now, all of those chips are going to end up being tested by the same tester. The purpose of a probe-card is to customize the tester, so it can test these different chips. And so, that's how you reconcile the different growth cycles between probe-cards and ATE or testers. We've seen this before in the past, right. In Foundry and Logic, there's been large stubs of tester investment that then cool off, and we see some strong probe-card activity as customers release new chip designs to be able to utilize those testers. So, often through history, in both Foundry and Logic and memory, we've seen that decoupling. As to the transition from HBM3 to HBM3e to HBM4, we view this as being helpful to FormFactor, not just because of an increase in the available market. Remember, almost certainly, when we go from HBM3 to HBM4, the number of dye increases in the stack. I mentioned in the prepared remarks going from 8 to 16. That's all other things being equal, going to require more probe-cards. But I think the other thing that's interesting is, and that's what we generally refer to as test intensity. I think the other thing is, when you look at customer roadmaps, as they go from HBM3e to HBM4, there's some significant increases in things like speed and power density, which drive a more capable probe-card, which typically we're able to get a higher value, a higher ASP for. So, I hope that addresses the two elements of the question. But remember, probe-cards are a device-specific consumable, different buy cycles than capital equipment like AP.