Richard P. Wallace
Analyst · Stifel, Nicolaus
Yes, I don't think there's much difference actually. There's, I guess, probably, I'd say, maybe a little metrology bias because overlay becomes a bigger challenge. I do think that the 3D inspection challenge is pretty significant as well. But I think probably, it's a little biased toward metrology. But I wouldn't say by a lot. I don't have the data in front of me. But my gut says it's probably a little more metrology focused, although we had success with inspection. I mean, one of the big challenges people had and their fears, and I think we're not out of the woods yet because nobody's really ramped in production on it, was trying to figure out how, once you identify defects, you can deal with them because they're going to be varied and what is the -- how do you determine the root cause and then fix it. And we've got some clever inspection technology, as well as metrology and technology, to be able to penetrate those layers. But there's still this issue of fixing and moving forward. But overall, if I'd have to tip it, I'd tip it a little more toward the metrology side.
Patrick J. Ho - Stifel, Nicolaus & Co., Inc., Research Division: Okay, great. That's really helpful. And maybe a big-picture industry outlook. I think you've given us a good color of what you expect for 2014. But obviously, there are always a lot of moving pieces. If the industry does trend, and you've seen many of these upturns, a lot of time they track higher than expected. If there are key customer variables as we get into the second half of the year, where do you see the potential upside between foundry and, say, memory? Where's the greater chance for upside potential as the year progresses?